Our extensive background in process analysis and materials knowledge enable us to derive solutions to address critical technological challenges for our customers

Extensive Analytical Expertise

  • Thermal analysis: DSC, TGA, DMA
  • Additive and resin analysis
  • Electron and 3D optical microscopy
  • FTIR, ATR, XPS, Raman spectroscopy
  • Surface Science: TOF-SIMS and 3D profilometry

Extensive process experience and material knowledge enabling impeccable interpretation ability.

Image 29
(TOF-SIMS) Ion Map

Image 30 (1)
Scanning White Light
Interferometer (SWLI)

Image 31 (1)
High Density Polyethylene
(HDPE)

Image 28 (1)
Scanning White Light
Interferometer (SWLI)